1.0Heliotis AGhttps://www.heliotis.com/en/Heliotis Web Teamhttps://www.heliotis.com/en/author/webteam/Surface Characterization with 3D Metrology - Heliotis AGrich600338<blockquote class="wp-embedded-content" data-secret="lVhJvG14Wi"><a href="https://www.heliotis.com/en/tutorial/surface-characterization-with-3d-metrology/">Surface Characterization with 3D Metrology</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://www.heliotis.com/en/tutorial/surface-characterization-with-3d-metrology/embed/#?secret=lVhJvG14Wi" width="600" height="338" title="“Surface Characterization with 3D Metrology” — Heliotis AG" data-secret="lVhJvG14Wi" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script>
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https://www.heliotis.com/wp-content/uploads/2026/02/rauheit132.webp566492This tutorial provides an overview of three central areas of surface characterization: surface imperfections according to ISO 8785, profile-based roughness measurements according to ISO 21920, and areal 3D surface measurements according to ISO 25178. It highlights the differences between these approaches and the capabilities of modern optical 3D metrology.